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Improved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation

dc.contributor.authorNicolett, A. S.
dc.contributor.authorMartino, Joao Antonio
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-30T09:20:32Z
dc.date.available2021-09-30T09:20:32Z
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2052
dc.sourceIIOimport
dc.titleImproved channel length and series resistance extraction for short-channel MOSFETs suffering from mobility degradation
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1
dc.source.endpage4
dc.source.journalJournal of Solid-State Devices and Circuits
dc.source.issue1
dc.source.volume5
imec.availabilityPublished - open access


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