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Sub-wavelength lithography and variability-aware SRAM characterization

dc.contributor.authorDobrovolny, Petr
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorZuber, Paul
dc.date.accessioned2021-10-20T10:45:52Z
dc.date.available2021-10-20T10:45:52Z
dc.date.issued2012
dc.identifier.issn1210-2512
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/20616
dc.sourceIIOimport
dc.titleSub-wavelength lithography and variability-aware SRAM characterization
dc.typeJournal article
dc.contributor.imecauthorDobrovolny, Petr
dc.contributor.imecauthorZuber, Paul
dc.contributor.orcidimecDobrovolny, Petr::0000-0002-1465-481X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage219
dc.source.endpage224
dc.source.journalRadioengineering
dc.source.issue1
dc.source.volume21
imec.availabilityPublished - open access


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