dc.contributor.author | Ghedini Der Agopian, Paula | |
dc.contributor.author | Dalla Valle Martino, Márcio | |
dc.contributor.author | Gomes dos Santos Filho, Sebastio | |
dc.contributor.author | Martino, Joo Antonio | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Leonelli, Daniele | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-20T11:10:48Z | |
dc.date.available | 2021-10-20T11:10:48Z | |
dc.date.issued | 2012-12 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20717 | |
dc.source | IIOimport | |
dc.title | Temperature impact on the tunnel fet off-state current components | |
dc.type | Journal article | |
dc.contributor.imecauthor | Leonelli, Daniele | |
dc.source.peerreview | yes | |
dc.source.beginpage | 141 | |
dc.source.endpage | 146 | |
dc.source.journal | Solid-State Electronics | |
dc.source.volume | 78 | |
imec.availability | Published - imec | |