dc.contributor.author | Ling, Fangzhou | |
dc.contributor.author | De Coster, Jeroen | |
dc.contributor.author | Witvrouw, Ann | |
dc.contributor.author | Celis, J. P. | |
dc.contributor.author | De Wolf, Ingrid | |
dc.date.accessioned | 2021-10-20T12:49:12Z | |
dc.date.available | 2021-10-20T12:49:12Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 0026-2714 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21034 | |
dc.source | IIOimport | |
dc.title | Study of glass frit induced stiction using a micromirror array | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Coster, Jeroen | |
dc.contributor.imecauthor | De Wolf, Ingrid | |
dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2256 | |
dc.source.endpage | 2260 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 9_10 | |
dc.source.volume | 52 | |
imec.availability | Published - open access | |
imec.internalnotes | 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis | |