dc.contributor.author | Nazir, Aftab | |
dc.contributor.author | Eyben, Pierre | |
dc.contributor.author | Clarysse, Trudo | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Schulze, Andreas | |
dc.contributor.author | Mody, Jay | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-20T13:49:34Z | |
dc.date.available | 2021-10-20T13:49:34Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21191 | |
dc.source | IIOimport | |
dc.title | Understanding device performance by incorporating 2D-carrier profiles from high resolution scanning spreading resistance microscopy into device simulations | |
dc.type | Journal article | |
dc.contributor.imecauthor | Nazir, Aftab | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 38 | |
dc.source.endpage | 42 | |
dc.source.journal | Solid-State Electronics | |
dc.source.volume | 74 | |
imec.availability | Published - imec | |
imec.internalnotes | Selected papers ESSDERC 2011 | |