Impact of the series resistance on the parameter extraction of submicron silicon metal-oxide-semiconductor transistors operated at 77K (Note)

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.date.accessioned	2021-09-30T09:32:35Z
dc.date.available	2021-09-30T09:32:35Z
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/2142
dc.source	IIOimport
dc.title	Impact of the series resistance on the parameter extraction of submicron silicon metal-oxide-semiconductor transistors operated at 77K (Note)
dc.type	Journal article
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.embargo	9999-12-31
dc.source.peerreview	no
dc.source.beginpage	659
dc.source.endpage	661
dc.source.journal	Solid State Electronics
dc.source.issue	4
dc.source.volume	41
imec.availability	Published - open access