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dc.contributor.authorShimura, Y.
dc.contributor.authorTakeuchi, Shotaro
dc.contributor.authorNakatsuka, O.
dc.contributor.authorVincent, Benjamin
dc.contributor.authorGencarelli, Federica
dc.contributor.authorClarysse, Trudo
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorCaymax, Matty
dc.contributor.authorLoo, Roger
dc.contributor.authorJensen, A.
dc.contributor.authorPetersen, D. H.
dc.contributor.authorZaima, S.
dc.date.accessioned2021-10-20T16:04:26Z
dc.date.available2021-10-20T16:04:26Z
dc.date.issued2012
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21502
dc.sourceIIOimport
dc.titleIn-situ Ga doping of fully strained Ge1-xSnx heteroepitaxial layers grown on Ge(001) substrates
dc.typeJournal article
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3206
dc.source.endpage3210
dc.source.journalThin Solid Films
dc.source.issue8
dc.source.volume520
imec.availabilityPublished - open access
imec.internalnotesICSI-7 paper


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