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Low-frequency-noise investigation of n-channel bulk FinFETs developed for one-transistor memory cells

dc.contributor.authorSimoen, Eddy
dc.contributor.authorde Andrade, M.G.C.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-20T16:09:13Z
dc.date.available2021-10-20T16:09:13Z
dc.date.issued2012
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21512
dc.sourceIIOimport
dc.titleLow-frequency-noise investigation of n-channel bulk FinFETs developed for one-transistor memory cells
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1272
dc.source.endpage1278
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue5
dc.source.volume59
imec.availabilityPublished - open access


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