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Deep level studies in high-temperature annealed silicon wafers for layer transfer in thin-film solar cells

dc.contributor.authorSimoen, Eddy
dc.contributor.authorDepauw, Valerie
dc.contributor.authorGordon, Ivan
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-20T16:10:09Z
dc.date.available2021-10-20T16:10:09Z
dc.date.issued2012
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21514
dc.sourceIIOimport
dc.titleDeep level studies in high-temperature annealed silicon wafers for layer transfer in thin-film solar cells
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDepauw, Valerie
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDepauw, Valerie::0000-0003-2045-9698
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewyes
dc.source.beginpage1857
dc.source.endpage1860
dc.source.conferenceE-MRS Spring Meeting Symposium A
dc.source.conferencedate14/05/2012
dc.source.conferencelocationStraatsburg France
dc.source.journalPhysica Status Solidi A
dc.source.issue10
dc.source.volume209
imec.availabilityPublished - imec


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