Show simple item record

Improved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors

dc.contributor.authorSun, Xiao
dc.contributor.authorMerckling, Clement
dc.contributor.authorBrammertz, Guy
dc.contributor.authorLin, Dennis
dc.contributor.authorDekoster, Johan
dc.contributor.authorCui, Sharin
dc.contributor.authorMa, T. P.
dc.date.accessioned2021-10-20T16:37:27Z
dc.date.available2021-10-20T16:37:27Z
dc.date.issued2012
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21572
dc.sourceIIOimport
dc.titleImproved AC conductance and Gray-Brown methods to characterize fast and slow traps in Ge metal–oxide–semiconductor capacitors
dc.typeJournal article
dc.contributor.imecauthorSun, Xiao
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorDekoster, Johan
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage54102
dc.source.journalJournal of Applied Physics
dc.source.issue5
dc.source.volume111
imec.availabilityPublished - imec


Files in this item

Thumbnail
Name:
25855.pdf
Size:
1.142Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record