dc.contributor.author | Van Besien, Els | |
dc.contributor.author | Pantouvaki, Marianna | |
dc.contributor.author | Zhao, Larry | |
dc.contributor.author | De Roest, David | |
dc.contributor.author | Baklanov, Mikhaïl | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Beyer, Gerald | |
dc.date.accessioned | 2021-10-20T17:32:02Z | |
dc.date.available | 2021-10-20T17:32:02Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 0167-9317 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21682 | |
dc.source | IIOimport | |
dc.title | Influence of porosity on electrical properties of low-k dielectrics | |
dc.type | Journal article | |
dc.contributor.imecauthor | Van Besien, Els | |
dc.contributor.imecauthor | Pantouvaki, Marianna | |
dc.contributor.imecauthor | De Roest, David | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.orcidimec | Van Besien, Els::0000-0002-5174-2229 | |
dc.date.embargo | 9999-12-31 | |
dc.identifier.doi | 10.1016/j.mee.2011.04.015 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 59 | |
dc.source.endpage | 61 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 1 | |
dc.source.volume | 92 | |
imec.availability | Published - open access | |
imec.internalnotes | 27th Annual Advanced Metallization Conference 2010 | |