Surface wave sensors based on nanometric layers of strongly absorbing materials
dc.contributor.author | Zhang, Yichen | |
dc.contributor.author | Arnold, Christophe | |
dc.contributor.author | Offermans, Peter | |
dc.contributor.author | Rivas, Jaime G. | |
dc.date.accessioned | 2021-10-20T19:40:20Z | |
dc.date.available | 2021-10-20T19:40:20Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 1094-4087 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/21928 | |
dc.source | IIOimport | |
dc.title | Surface wave sensors based on nanometric layers of strongly absorbing materials | |
dc.type | Journal article | |
dc.contributor.imecauthor | Offermans, Peter | |
dc.contributor.orcidimec | Offermans, Peter::0000-0001-5823-270X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 9431 | |
dc.source.endpage | 9441 | |
dc.source.journal | Optics Express | |
dc.source.issue | 9 | |
dc.source.volume | 20 | |
imec.availability | Published - open access |