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Experimental comparison between pMuGTFET and pFinFET analog performance as a function of temperature

dc.contributor.authorAgopian, Paula G. D.
dc.contributor.authorMartino, Joo Antonio
dc.contributor.authorRooyackers, Rita
dc.contributor.authorVandooren, Anne
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-21T06:42:07Z
dc.date.available2021-10-21T06:42:07Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21955
dc.sourceIIOimport
dc.titleExperimental comparison between pMuGTFET and pFinFET analog performance as a function of temperature
dc.typeJournal article
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage2493
dc.source.endpage2497
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue8
dc.source.volume60
imec.availabilityPublished - imec


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