Show simple item record

Electrical characterization of functional oxides for resistive random access memory (RRAM) application

dc.contributor.authorChen, Yangyin
dc.date.accessioned2021-10-21T06:56:51Z
dc.date.available2021-10-21T06:56:51Z
dc.date.issued2013-06
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22133
dc.sourceIIOimport
dc.titleElectrical characterization of functional oxides for resistive random access memory (RRAM) application
dc.typePHD thesis
dc.contributor.imecauthorChen, Yangyin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.contributor.thesisadvisorGroeseneken, Guido
dc.contributor.thesisadvisorWouters, Dirk
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35804.pdf
Size:
17.53Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record