dc.contributor.author | Clima, Sergiu | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Govoreanu, Bogdan | |
dc.contributor.author | Popovici, Mihaela Ioana | |
dc.contributor.author | Swerts, Johan | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | De Gendt, Stefan | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.date.accessioned | 2021-10-21T07:00:52Z | |
dc.date.available | 2021-10-21T07:00:52Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0741-3106 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22159 | |
dc.source | IIOimport | |
dc.title | Determination of ultimate leakage through rutile TiO2 and tetragonal ZrO2 from ab initio complex band calculations | |
dc.type | Journal article | |
dc.contributor.imecauthor | Clima, Sergiu | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Govoreanu, Bogdan | |
dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
dc.contributor.imecauthor | Swerts, Johan | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.orcidimec | Clima, Sergiu::0000-0002-4044-9975 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 402 | |
dc.source.endpage | 403 | |
dc.source.journal | IEEE Electron Device Letters | |
dc.source.issue | 3 | |
dc.source.volume | 34 | |
dc.identifier.url | http://dx.doi.org/10.1109/TED.2012.2200688 | |
imec.availability | Published - open access | |