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Impact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits

dc.contributor.authorCrupi, F.
dc.contributor.authorAlbano, D.
dc.contributor.authorAlioto, M.
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSelmi, L.
dc.contributor.authorMitard, Jerome
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T07:06:09Z
dc.date.available2021-10-21T07:06:09Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22192
dc.sourceIIOimport
dc.titleImpact of high-mobility materials on the performance of near- and sub-threshold CMOS logic circuits
dc.typeJournal article
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage972
dc.source.endpage977
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue3
dc.source.volume60
imec.availabilityPublished - open access


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