Low-frequency noise of n-type triple gate FinFETs fabrictaed on standard 45o rotated substrates
dc.contributor.author | Doria, Rodrigo | |
dc.contributor.author | Martino, Joao | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.contributor.author | Pavanello, Marcello | |
dc.date.accessioned | 2021-10-21T07:21:37Z | |
dc.date.available | 2021-10-21T07:21:37Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22275 | |
dc.source | IIOimport | |
dc.title | Low-frequency noise of n-type triple gate FinFETs fabrictaed on standard 45o rotated substrates | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 121 | |
dc.source.endpage | 126 | |
dc.source.journal | Solid-State Electronics | |
dc.source.volume | 90 | |
imec.availability | Published - open access |