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On the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs

dc.contributor.authorDos Santos, Sara
dc.contributor.authorNicoletti, Talitha
dc.contributor.authorMartino, Joao A.
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorVeloso, Anabela
dc.contributor.authorJurczak, Gosia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-21T07:22:30Z
dc.date.available2021-10-21T07:22:30Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22279
dc.sourceIIOimport
dc.titleOn the variability of the front-/back-channel LF noise in UTBOX SOI nMOSFETs
dc.typeJournal article
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage444
dc.source.endpage450
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue1
dc.source.volume60
imec.availabilityPublished - imec


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