High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (Editorial)
dc.contributor.author | Eyben, Pierre | |
dc.date.accessioned | 2021-10-21T07:33:04Z | |
dc.date.available | 2021-10-21T07:33:04Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 2190-4286 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/22326 | |
dc.source | IIOimport | |
dc.title | High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices (Editorial) | |
dc.type | Journal article | |
dc.contributor.imecauthor | Eyben, Pierre | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 318 | |
dc.source.endpage | 319 | |
dc.source.journal | Beilstein Journal of Nanotechnology | |
dc.source.volume | 4 | |
dc.identifier.url | http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-4-35 | |
imec.availability | Published - open access |