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Gate current random telegraph noise and single defect conduction

dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-21T08:39:28Z
dc.date.available2021-10-21T08:39:28Z
dc.date.issued2013
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22564
dc.sourceIIOimport
dc.titleGate current random telegraph noise and single defect conduction
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage123
dc.source.endpage125
dc.source.journalMicroelectronic Engineering
dc.source.volume109
imec.availabilityPublished - open access
imec.internalnotesINFOS paper Cracow 2013


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