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Counterdoped pocket thickness optimization of tunnel field-effect transistors

dc.contributor.authorKao, Frank
dc.contributor.authorVerhulst, Anne
dc.contributor.authorVandenberghe, William
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-21T08:40:39Z
dc.date.available2021-10-21T08:40:39Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22568
dc.sourceIIOimport
dc.titleCounterdoped pocket thickness optimization of tunnel field-effect transistors
dc.typeJournal article
dc.contributor.imecauthorKao, Frank
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.source.peerreviewyes
dc.source.beginpage6
dc.source.endpage12
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue1
dc.source.volume60
imec.availabilityPublished - imec


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