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BTI analysis, monitoring and mitigation for nano scaled circuits

dc.contributor.authorKhan, Seyab
dc.date.accessioned2021-10-21T08:50:04Z
dc.date.available2021-10-21T08:50:04Z
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22596
dc.sourceIIOimport
dc.titleBTI analysis, monitoring and mitigation for nano scaled circuits
dc.typePHD thesis
dc.source.peerreviewno
dc.contributor.thesisadvisorHamdioui, Said
dc.contributor.thesisadvisorCatthoor, Francky
imec.availabilityPublished - imec


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