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Leakage modeling and flat field correction algorithm for CMOS hyper spectral imaging sensor

dc.contributor.authorLiu, Shuyang
dc.contributor.authorMainali, Pradip
dc.contributor.authorTack, Klaas
dc.contributor.authorLauwereins, Rudy
dc.date.accessioned2021-10-21T09:28:56Z
dc.date.available2021-10-21T09:28:56Z
dc.date.issued2013
dc.identifier.issn2010-3697
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22710
dc.sourceIIOimport
dc.titleLeakage modeling and flat field correction algorithm for CMOS hyper spectral imaging sensor
dc.typeJournal article
dc.contributor.imecauthorTack, Klaas
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage30
dc.source.endpage35
dc.source.journalInternational Journal of Modeling and Optimization
dc.source.issue1
dc.source.volume3
dc.identifier.urlhttp://www.ijmo.org/index.php?m=content&c=index&a=show&catid=35&id=187
imec.availabilityPublished - open access


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