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SIFER: Scale-Invariant Feature Detector with Error Resilience

dc.contributor.authorMainali, Pradip
dc.contributor.authorLafruit, Gauthier
dc.contributor.authorYang, Qiong
dc.contributor.authorGeelen, Bert
dc.contributor.authorVan Gool, Luc
dc.contributor.authorLauwereins, Rudy
dc.date.accessioned2021-10-21T09:41:47Z
dc.date.available2021-10-21T09:41:47Z
dc.date.issued2013
dc.identifier.issn0920-5691
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22746
dc.sourceIIOimport
dc.titleSIFER: Scale-Invariant Feature Detector with Error Resilience
dc.typeJournal article
dc.contributor.imecauthorGeelen, Bert
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.orcidimecGeelen, Bert::0000-0002-9928-9064
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage172
dc.source.endpage197
dc.source.journalInternational Journal of Computer Vision
dc.source.issue2
dc.source.volume104
dc.identifier.urlhttp://dx.doi.org/10.1007/s11263-013-0622-3
imec.availabilityPublished - open access


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