Show simple item record

Reliability analysis of permanent degradations on AlGaN/GaN HEMTs

dc.contributor.authorMarcon, Denis
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorWu, Tian-Li
dc.contributor.authorStoffels, Steve
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorZanoni, Enrico
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-21T09:47:21Z
dc.date.available2021-10-21T09:47:21Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22760
dc.sourceIIOimport
dc.titleReliability analysis of permanent degradations on AlGaN/GaN HEMTs
dc.typeJournal article
dc.contributor.imecauthorMarcon, Denis
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3132
dc.source.endpage3141
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue10
dc.source.volume60
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
27330.pdf
Size:
1.592Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record