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Defects in Si foils fabricated by spalling at low temperatures: electrical activity and atomic nature

dc.contributor.authorMasolin, Alex
dc.contributor.authorSimoen, Eddy
dc.contributor.authorKepa, J.
dc.contributor.authorStesmans, Andre
dc.date.accessioned2021-10-21T09:55:14Z
dc.date.available2021-10-21T09:55:14Z
dc.date.issued2013
dc.identifier.issn0022-3727
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22782
dc.sourceIIOimport
dc.titleDefects in Si foils fabricated by spalling at low temperatures: electrical activity and atomic nature
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorStesmans, Andre
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.identifier.doi10.10988/022-3727/46/155501
dc.source.peerreviewyes
dc.source.beginpage155501
dc.source.journalJournal of Physics D: Applied Physics
dc.source.issue15
dc.source.volume46
imec.availabilityPublished - imec


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