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Optimizing the front and back biases for the best sense margin and retention time in UTBOX FBRAM

dc.contributor.authorMendes Almeida, Luciano
dc.contributor.authorSasaki, Katia
dc.contributor.authorCaillat, Christian
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, Joao
dc.date.accessioned2021-10-21T10:01:12Z
dc.date.available2021-10-21T10:01:12Z
dc.date.issued2013
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22797
dc.sourceIIOimport
dc.titleOptimizing the front and back biases for the best sense margin and retention time in UTBOX FBRAM
dc.typeJournal article
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage149
dc.source.endpage154
dc.source.journalSolid-State Electronics
dc.source.volume90
imec.availabilityPublished - open access


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