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Demonstration of silicon-on-insulator mid-infrared spectrometers operating at 3.8μm

dc.contributor.authorMuneeb, Muhammad
dc.contributor.authorChen, X.
dc.contributor.authorVerheyen, Peter
dc.contributor.authorLepage, Guy
dc.contributor.authorPathak, Shibnath
dc.contributor.authorRyckeboer, Eva
dc.contributor.authorMalik, Aditya Singh
dc.contributor.authorKuyken, Bart
dc.contributor.authorNedeljkovic, M.
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorMashanovich, G.Z.
dc.contributor.authorRoelkens, Gunther
dc.date.accessioned2021-10-21T10:15:17Z
dc.date.available2021-10-21T10:15:17Z
dc.date.issued2013-04
dc.identifier.issn1094-4087
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22833
dc.sourceIIOimport
dc.titleDemonstration of silicon-on-insulator mid-infrared spectrometers operating at 3.8μm
dc.typeJournal article
dc.contributor.imecauthorMuneeb, Muhammad
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorLepage, Guy
dc.contributor.imecauthorRyckeboer, Eva
dc.contributor.imecauthorKuyken, Bart
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.orcidimecRyckeboer, Eva::0000-0001-8648-3258
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecVerheyen, Peter::0000-0002-8245-9442
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage11659
dc.source.endpage11669
dc.source.journalOptics Express
dc.source.issue10
dc.source.volume21
dc.identifier.urlhttp://www.opticsinfobase.org/oe/abstract.cfm?URI=oe-21-10-11659&origin=search
imec.availabilityPublished - imec


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