Authors

Nakashima, Toshiyuki; Yoneoka, Masashi; Tsunoda, Isao; Takakura, Kenichiro; Gonzalez, Mireia B; Simoen, Eddy; Claeys, Cor; Yoshino, Kenji

ISSN

0021-4922

Issue

9

Journal

Japanese Journal of Applied Physics

Volume

52

Title

Increased radiation hardness of short-channel electron-irradiated Si1-xGex source/drain p-type metal oxide semiconductor field-effect transistors at higher Ge content

Publication type

Journal article