dc.contributor.author | Schoeters, Bob | |
dc.contributor.author | Neyts, Erik | |
dc.contributor.author | Khalilov, Umedjon | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Partoens, Bob | |
dc.date.accessioned | 2021-10-21T11:46:36Z | |
dc.date.available | 2021-10-21T11:46:36Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 1463-9076 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23045 | |
dc.source | IIOimport | |
dc.title | Stability of Si epoxide defects in Si nanowires: a mixed reactive force field/DFT study | |
dc.type | Journal article | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 15091 | |
dc.source.endpage | 15097 | |
dc.source.journal | Physical Chemistry Chemical Physics | |
dc.source.issue | 36 | |
dc.source.volume | 15 | |
dc.identifier.url | http://pubs.rsc.org/en/content/articlelanding/2013/cp/c3cp51621k#!divAbstract | |
imec.availability | Published - imec | |