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A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications

dc.contributor.authorSchulze, Andreas
dc.contributor.authorVerhulst, Anne
dc.contributor.authorNazir, Aftab
dc.contributor.authorHantschel, Thomas
dc.contributor.authorEyben, Pierre
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-21T11:53:32Z
dc.date.available2021-10-21T11:53:32Z
dc.date.issued2013
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23061
dc.sourceIIOimport
dc.titleA comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
dc.typeJournal article
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorNazir, Aftab
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewyes
dc.source.beginpage114310
dc.source.journalJournal of Applied Physics
dc.source.issue11
dc.source.volume113
dc.identifier.urlhttp://link.aip.org/link/doi/10.1063/1.4795141
imec.availabilityPublished - imec


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