dc.contributor.author | Segers, Siegfried | |
dc.contributor.author | Lauwaert, Johan | |
dc.contributor.author | Clauws, Paul | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Vanhellemont, Jan | |
dc.contributor.author | Callens, Freddy | |
dc.contributor.author | Vrielinck, Henk | |
dc.date.accessioned | 2021-10-21T11:55:21Z | |
dc.date.available | 2021-10-21T11:55:21Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0022-3727 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23065 | |
dc.source | IIOimport | |
dc.title | Temperature-independent slow carrier emission from deep-level defects in p-type germanium | |
dc.type | Journal article | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 425101 | |
dc.source.journal | Journal of Physics D: Applied Physics | |
dc.source.issue | 42 | |
dc.source.volume | 46 | |
dc.identifier.url | http://m.iopscience.iop.org/0022-3727/46/42/425101/article | |
imec.availability | Published - imec | |