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dc.contributor.authorSegers, Siegfried
dc.contributor.authorLauwaert, Johan
dc.contributor.authorClauws, Paul
dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorCallens, Freddy
dc.contributor.authorVrielinck, Henk
dc.date.accessioned2021-10-21T11:55:21Z
dc.date.available2021-10-21T11:55:21Z
dc.date.issued2013
dc.identifier.issn0022-3727
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23065
dc.sourceIIOimport
dc.titleTemperature-independent slow carrier emission from deep-level defects in p-type germanium
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage425101
dc.source.journalJournal of Physics D: Applied Physics
dc.source.issue42
dc.source.volume46
dc.identifier.urlhttp://m.iopscience.iop.org/0022-3727/46/42/425101/article
imec.availabilityPublished - imec


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