Show simple item record

Localization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurements

dc.contributor.authorSilvestri, Marco
dc.contributor.authorUren, Michael
dc.contributor.authorKillat, Nicolle
dc.contributor.authorMarcon, Denis
dc.contributor.authorKuball, Martin
dc.date.accessioned2021-10-21T12:03:50Z
dc.date.available2021-10-21T12:03:50Z
dc.date.issued2013
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23083
dc.sourceIIOimport
dc.titleLocalization of off-stress-induced damage in AlGaNGaN HEMTs by means of low frequency 1/f noise measurements
dc.typeJournal article
dc.contributor.imecauthorMarcon, Denis
dc.date.embargo9999-12-31
dc.identifier.doi10.1063/1.4816424
dc.source.peerreviewyes
dc.source.beginpage43506
dc.source.journalApplied Physics Letters
dc.source.issue4
dc.source.volume103
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
043506_1_online.pdf
Size:
1.081Mb
Format:
PDF
Description:
Published version
View/open
Thumbnail
Name:
Localization_of_off-stress-ind ...
Size:
485.5Kb
Format:
PDF
Description:
Accepted version
View/open

This item appears in the following collection(s)

Show simple item record