dc.contributor.author | Vandooren, Anne | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Leonelli, Daniele | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Devriendt, Katia | |
dc.contributor.author | Demand, Marc | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Huyghebaert, Cedric | |
dc.date.accessioned | 2021-10-21T13:45:47Z | |
dc.date.available | 2021-10-21T13:45:47Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 0038-1101 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23295 | |
dc.source | IIOimport | |
dc.title | Analysis of trap-assisted tunneling in vertical Si homo-junction and SiGe hetero-junction tunnel-FETs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Vandooren, Anne | |
dc.contributor.imecauthor | Leonelli, Daniele | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Devriendt, Katia | |
dc.contributor.imecauthor | Demand, Marc | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Huyghebaert, Cedric | |
dc.contributor.orcidimec | Vandooren, Anne::0000-0002-2412-0176 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Devriendt, Katia::0000-0002-0662-7926 | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Huyghebaert, Cedric::0000-0001-6043-7130 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 50 | |
dc.source.endpage | 55 | |
dc.source.journal | Solid-State Electronics | |
dc.source.volume | 83 | |
dc.identifier.url | http://www.sciencedirect.com/science/article/pii/S0038110113000397 | |
imec.availability | Published - imec | |