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Wafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature

dc.contributor.authorVereecke, Bart
dc.contributor.authorvan der Veen, Marleen
dc.contributor.authorSugiura, Masahito
dc.contributor.authorKashiwagi, Yusaku
dc.contributor.authorKe, Xiaoxing
dc.contributor.authorCott, Daire
dc.contributor.authorHantschel, Thomas
dc.contributor.authorHuyghebaert, Cedric
dc.contributor.authorTokei, Zsolt
dc.date.accessioned2021-10-21T14:04:42Z
dc.date.available2021-10-21T14:04:42Z
dc.date.issued2013
dc.identifier.issn0021-4922
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23330
dc.sourceIIOimport
dc.titleWafer level electrical evaluation of vertical carbon nanotube bundles as a function of the growth temperature
dc.typeJournal article
dc.contributor.imecauthorVereecke, Bart
dc.contributor.imecauthorvan der Veen, Marleen
dc.contributor.imecauthorCott, Daire
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorHuyghebaert, Cedric
dc.contributor.imecauthorTokei, Zsolt
dc.contributor.orcidimecvan der Veen, Marleen::0000-0002-9402-8922
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecHuyghebaert, Cedric::0000-0001-6043-7130
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage04CN02
dc.source.journalJapanese Journal of Applied Physics
dc.source.issue4
dc.source.volume52
dc.identifier.urlhttp://jjap.jsap.jp/link?JJAP/52/04CN02/
imec.availabilityPublished - open access


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