Show simple item record

Part II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurements

dc.contributor.authorWalke, Amey
dc.contributor.authorVandooren, Anne
dc.contributor.authorKaczer, Ben
dc.contributor.authorVerhulst, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorSimoen, Eddy
dc.contributor.authorHeyns, Marc
dc.contributor.authorRao, V Ramgopal
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-21T14:23:26Z
dc.date.available2021-10-21T14:23:26Z
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23368
dc.sourceIIOimport
dc.titlePart II: Investigation of subthreshold swing in line tunnel FETs using bias stress measurements
dc.typeJournal article
dc.contributor.imecauthorWalke, Amey
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage4065
dc.source.endpage4072
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue12
dc.source.volume60
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6658861&queryText%3DPart+II%3A+Investigation+of+subthreshold+swin
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record