Structural characterization of N-face GaN epilayers grown on Ge (111) by plasma assisted molecular beam epitaxy
dc.contributor.author | Zhang, Liyang | |
dc.contributor.author | Lieten, Ruben | |
dc.contributor.author | Zhu, Tongtong | |
dc.contributor.author | Leys, Maarten | |
dc.contributor.author | Jiang, Sijia | |
dc.contributor.author | Borghs, Gustaaf | |
dc.date.accessioned | 2021-10-21T15:05:31Z | |
dc.date.available | 2021-10-21T15:05:31Z | |
dc.date.issued | 2013 | |
dc.identifier.issn | 1466-8033 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23446 | |
dc.source | IIOimport | |
dc.title | Structural characterization of N-face GaN epilayers grown on Ge (111) by plasma assisted molecular beam epitaxy | |
dc.type | Journal article | |
dc.contributor.imecauthor | Lieten, Ruben | |
dc.contributor.imecauthor | Borghs, Gustaaf | |
dc.identifier.doi | 10.1039/C3CE41836G | |
dc.source.peerreview | yes | |
dc.source.beginpage | 10590 | |
dc.source.endpage | 10596 | |
dc.source.journal | CrystEngComm | |
dc.source.volume | 15 | |
imec.availability | Published - imec |
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