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dc.contributor.authorAoulaiche, Marc
dc.contributor.authorBravaix, Alain
dc.contributor.authorSimoen, Eddy
dc.contributor.authorCaillat, Christian
dc.contributor.authorCho, Moon Ju
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorBlomme, Pieter
dc.contributor.authorFazan, Pierre
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-22T00:43:42Z
dc.date.available2021-10-22T00:43:42Z
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23494
dc.sourceIIOimport
dc.titleEndurance of one transistor floating body RAM on UTBOX SOI
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorBlomme, Pieter
dc.contributor.imecauthorFazan, Pierre
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage801
dc.source.endpage805
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue3
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/abstractKeywords.jsp?reload=true&arnumber=6734707&sortType%3Dasc_p_Sequence%26filter%3DAND(p_IS_N
imec.availabilityPublished - open access


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