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dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.contributor.authorScholz, Mirko
dc.contributor.authorHuang, Yu-Ching
dc.contributor.authorHellings, Geert
dc.contributor.authorBoschke, Roman
dc.contributor.authorKer, Ming-Dou
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T00:55:43Z
dc.date.available2021-10-22T00:55:43Z
dc.date.issued2014-06
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23634
dc.sourceIIOimport
dc.titleLocal CDM ESD protection circuits for cross-power domains in 3D IC applications
dc.typeJournal article
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.source.peerreviewyes
dc.source.beginpage781
dc.source.endpage783
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue2
dc.source.volume14
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6807728
imec.availabilityPublished - imec


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