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Correlation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs

dc.contributor.authorLin, X. W.
dc.contributor.authorWatté, J.
dc.contributor.authorWuyts, Koen
dc.contributor.authorLiliental-Weber, Z.
dc.contributor.authorWashburn, J.
dc.date.accessioned2021-09-29T12:43:16Z
dc.date.available2021-09-29T12:43:16Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/236
dc.sourceIIOimport
dc.titleCorrelation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs
dc.typeProceedings paper
dc.source.peerreviewno
dc.source.beginpage295
dc.source.endpage300
dc.source.conferenceAdvanced Metallization for Devices and Circuits : Science, Technology and Manufacturability; April 4-8, 1994; San Francisco, Cal
imec.availabilityPublished - imec


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