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Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells

dc.contributor.authorDevulder, Wouter
dc.contributor.authorOpsomer, Karl
dc.contributor.authorFranquet, Alexis
dc.contributor.authorMeersschaut, Johan
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorMuller, Robert
dc.contributor.authorDe Schutter, Bob
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGoux, Ludovic
dc.contributor.authorDetavernier, Christophe
dc.date.accessioned2021-10-22T01:15:54Z
dc.date.available2021-10-22T01:15:54Z
dc.date.issued2014
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23758
dc.sourceIIOimport
dc.titleInfluence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
dc.typeJournal article
dc.contributor.imecauthorDevulder, Wouter
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorFranquet, Alexis
dc.contributor.imecauthorMeersschaut, Johan
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.orcidimecDevulder, Wouter::0000-0002-5156-0177
dc.contributor.orcidimecFranquet, Alexis::0000-0002-7371-8852
dc.contributor.orcidimecMeersschaut, Johan::0000-0003-2467-1784
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage54501
dc.source.journalJournal of Applied Physics
dc.source.issue5
dc.source.volume115
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/jap/115/5/10.1063/1.4863722
imec.availabilityPublished - imec


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