dc.contributor.author | Goux, Ludovic | |
dc.contributor.author | Fantini, Andrea | |
dc.contributor.author | Chen, Yangyin | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Jurczak, Gosia | |
dc.date.accessioned | 2021-10-22T01:41:31Z | |
dc.date.available | 2021-10-22T01:41:31Z | |
dc.date.issued | 2014 | |
dc.identifier.issn | 2162-8726 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/23870 | |
dc.source | IIOimport | |
dc.title | Evidences of electrode-controlled retention properties in Ta2O5-based resistive-switching memory cells | |
dc.type | Journal article | |
dc.contributor.imecauthor | Goux, Ludovic | |
dc.contributor.imecauthor | Fantini, Andrea | |
dc.contributor.imecauthor | Chen, Yangyin | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.orcidimec | Goux, Ludovic::0000-0002-1276-2278 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | Q79 | |
dc.source.endpage | Q81 | |
dc.source.journal | ECS Solid State Letters | |
dc.source.issue | 11 | |
dc.source.volume | 3 | |
dc.identifier.url | http://ssl.ecsdl.org/content/3/11/Q79.short?rss=1 | |
imec.availability | Published - open access | |