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Local traps as nanoscale reaction-diffusion probes: B clustering in c-Si

dc.contributor.authorHantschel, Thomas
dc.contributor.authorPawlak, B.J.
dc.contributor.authorCowern, N.E.B.
dc.contributor.authorAhn, C.
dc.contributor.authorVandervorst, Wilfried
dc.contributor.authorGwilliam, R.
dc.contributor.authorvan Berkum, J.G.M.
dc.date.accessioned2021-10-22T01:50:36Z
dc.date.available2021-10-22T01:50:36Z
dc.date.issued2014
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23904
dc.sourceIIOimport
dc.titleLocal traps as nanoscale reaction-diffusion probes: B clustering in c-Si
dc.typeJournal article
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewyes
dc.source.beginpage221603
dc.source.journalApplied Physics Letters
dc.source.issue22
dc.source.volume105
dc.identifier.urlhttp://scitation.aip.org/content/aip/journal/apl/105/22/10.1063/1.4902972
imec.availabilityPublished - imec


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