Show simple item record

Statistical distribution of defect parameters

dc.contributor.authorKaczer, Ben
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWeckx, Pieter
dc.date.accessioned2021-10-22T02:25:39Z
dc.date.available2021-10-22T02:25:39Z
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24023
dc.sourceIIOimport
dc.titleStatistical distribution of defect parameters
dc.typeBook chapter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.source.peerreviewno
dc.source.beginpage161
dc.source.bookBias Temperature Instability for Devices and Circuits
dc.source.endpage176
imec.availabilityPublished - imec
imec.internalnotesISBN 978-1-4614-7909-3


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record