dc.contributor.author | Kao, Frank | |
dc.contributor.author | Verhulst, Anne | |
dc.contributor.author | Rooyackers, Rita | |
dc.contributor.author | Douhard, Bastien | |
dc.contributor.author | Delmotte, Joris | |
dc.contributor.author | Bender, Hugo | |
dc.contributor.author | Richard, Olivier | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Hikavyy, Andriy | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Arstila, Kai | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | De Meyer, Kristin | |
dc.date.accessioned | 2021-10-22T02:28:21Z | |
dc.date.available | 2021-10-22T02:28:21Z | |
dc.date.issued | 2014 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24031 | |
dc.source | IIOimport | |
dc.title | Compressively strained SiGe band-to-band tunneling model calibration based on p-i-n diodes and prospects of strained SiGe tunneling field-effect transistors | |
dc.type | Journal article | |
dc.contributor.imecauthor | Kao, Frank | |
dc.contributor.imecauthor | Verhulst, Anne | |
dc.contributor.imecauthor | Douhard, Bastien | |
dc.contributor.imecauthor | Bender, Hugo | |
dc.contributor.imecauthor | Richard, Olivier | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Hikavyy, Andriy | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.orcidimec | Verhulst, Anne::0000-0002-3742-9017 | |
dc.contributor.orcidimec | Richard, Olivier::0000-0002-3994-8021 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.contributor.orcidimec | Hikavyy, Andriy::0000-0002-8201-075X | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 214506 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 21 | |
dc.source.volume | 116 | |
dc.identifier.url | http://dx.doi.org/10.1063/1.4903288 | |
imec.availability | Published - imec | |