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ESD issues in compound semiconductor high-frequency devices and circuits

dc.contributor.authorBock, Karlheinz
dc.date.accessioned2021-09-30T11:28:56Z
dc.date.available2021-09-30T11:28:56Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2403
dc.sourceIIOimport
dc.titleESD issues in compound semiconductor high-frequency devices and circuits
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1781
dc.source.endpage1793
dc.source.journalMicroelectronics Reliability
dc.source.issue11
dc.source.volume38
imec.availabilityPublished - imec


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