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Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates

dc.contributor.authorKukner, Halil
dc.contributor.authorKhan, Seyab
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorHamdioui, Said
dc.contributor.authorKaczer, Ben
dc.contributor.authorCatthoor, Francky
dc.contributor.authorVan der Perre, Liesbet
dc.contributor.authorLauwereins, Rudy
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-22T02:42:09Z
dc.date.available2021-10-22T02:42:09Z
dc.date.issued2014
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24073
dc.sourceIIOimport
dc.titleComparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
dc.typeJournal article
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorLauwereins, Rudy
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecLauwereins, Rudy::0000-0002-3861-0168
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage182
dc.source.endpage193
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue1
dc.source.volume14
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6529142&queryText%3DComparison+of+reaction-diffusion+and+atomisti
imec.availabilityPublished - open access


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