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300 mm wafer-level, ultra-dense arrays of Au-capped nanopillars with sub-10 nm gaps as reliable SERS substrates

dc.contributor.authorLi, Jiaqi
dc.contributor.authorChen, Chang
dc.contributor.authorJans, Hilde
dc.contributor.authorXu, XiuMei
dc.contributor.authorVerellen, Niels
dc.contributor.authorVos, Ingrid
dc.contributor.authorOkumura, Yasuaki
dc.contributor.authorMoshchalkov, Victor
dc.contributor.authorLagae, Liesbet
dc.contributor.authorVan Dorpe, Pol
dc.date.accessioned2021-10-22T02:59:15Z
dc.date.available2021-10-22T02:59:15Z
dc.date.issued2014
dc.identifier.issn2040-3364
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24125
dc.sourceIIOimport
dc.title300 mm wafer-level, ultra-dense arrays of Au-capped nanopillars with sub-10 nm gaps as reliable SERS substrates
dc.typeJournal article
dc.contributor.imecauthorJans, Hilde
dc.contributor.imecauthorXu, XiuMei
dc.contributor.imecauthorVerellen, Niels
dc.contributor.imecauthorVos, Ingrid
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorVan Dorpe, Pol
dc.contributor.orcidimecXu, XiuMei::0000-0002-3356-8693
dc.contributor.orcidimecVerellen, Niels::0000-0001-5110-4158
dc.contributor.orcidimecVan Dorpe, Pol::0000-0003-0918-1664
dc.source.peerreviewyes
dc.source.beginpage12391
dc.source.endpage12396
dc.source.journalNanoscale
dc.source.issue21
dc.source.volume6
dc.identifier.urlhttp://pubs.rsc.org/en/content/articlelanding/2014/nr/c4nr04315d#!divAbstract
imec.availabilityPublished - imec


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