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Assessment methodology of the lateral migration component in data retention of 3D SONOS memories

dc.contributor.authorLiu, Lifang
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorLiyang, Pan
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-22T03:10:11Z
dc.date.available2021-10-22T03:10:11Z
dc.date.issued2014
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24151
dc.sourceIIOimport
dc.titleAssessment methodology of the lateral migration component in data retention of 3D SONOS memories
dc.typeJournal article
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.source.peerreviewyes
dc.source.beginpage1697
dc.source.endpage1701
dc.source.journalMicroelectronics Reliability
dc.source.issue9_10
dc.source.volume54
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0026271414002662
imec.availabilityPublished - imec
imec.internalnotesSpecial isse ESREF Conference


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