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Accurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion

dc.contributor.authorNazir, Aftab
dc.contributor.authorSpessot, Alessio
dc.contributor.authorEyben, Pierre
dc.contributor.authorClarysse, Trudo
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorSchram, Tom
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-22T04:13:53Z
dc.date.available2021-10-22T04:13:53Z
dc.date.issued2014
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/24313
dc.sourceIIOimport
dc.titleAccurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion
dc.typeJournal article
dc.contributor.imecauthorNazir, Aftab
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2633
dc.source.endpage2639
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue8
dc.source.volume61
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6837476&contentType=Journals+%26+Magazines
imec.availabilityPublished - open access


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